• 1989

Company Description

Chapman Instruments offers laser-based surface profilers for wafer industry process and quality control.

When It comes to measuring your manufacturing success, only Chapman Instruments offers a total solution for surface profiling and thickness gauging. In 1989, with the release of the world's first ultraprecision laser-based surface profiler, Chapman instruments assumed a leadership role in wafer-industry process and quality control. That heritage continues today with leading-edge innovation of new products designed to help their customers maximize quality, efficiency, and productivity.